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Introduction To Test Data Formats

构成完整和完全兼容的STDF或ATDF文件的部分。

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此博客旨在提供STDF和ATDF数据格式的简介。这并不意图是最终的,只有介绍。如果您经过在电子表格和表中看到数据,则STDF与您习惯的数据非常不同。在这里,我们试图解释。

STDF.is the “Standard Test Data Format” developed jointly between some of the largest test equipment vendors and semiconductor companies. This is a binary format defined by the STDF V4 specification.

ATDF is an ASCII version of STDF. While STDF is a binary format, ATDF is ASCII and so readable in any text viewer. The binary format is faster for the tester computer to write as there is no need to convert any number or letter formats. As test time affects the cost of the product, it is often preferred to use the format that takes the least time to write.

The formats are fully defined and explained in the relevant specifications. This article will, however, offer a much-simplified introduction to the formats. The structure from here on is largely the same between STDF and ATDF, all examples shown are by their nature ATDF as a string of 1s and 0s is not very easy to understand.

STDF.is a stream of data. There is a start of file section. Then any number of tests, die (devices) and results can be added before the file is closed. This has the advantage that the file can be directly written during the test and a partial file can (it is possible but not always) contain useable data.

The format is organized by defined record types. Each record type is defined in the specifications as to the type of data contained, the size limit of that data and the data type of the field. In general, yieldHUB fields directly follow the STDF V4 specification.

Here is an overview of the format, this is not extensive but is a simplified view to ease understanding. The format is made up of sets of records to organize the data. For a complete and fully compatible file, many record types must be present. Having records missing is one of the most common issues with STDF data.

Global meta data

  • Global record for the file: FAR
  • Global record for the lot: MIR
  • Pin Map Record: PMR [When using MPR]
  • Global site description: SDR
  • 晶圆配置:WCR [测试晶圆时]

Test data when testing wafers

For each wafer

  • Record for first wafer: WIR
  • For each part
    • 整体骰子的记录:PIR
    • 对于每个测试:
      • 参数测试结果:PTR [您的程序中每个数字限制测试]
      • Results for functional tests: FTR [One for each Pass/Fail test in your program]
      • Multi-Pin Parametric Test Result: MPR [contains an array of data where the test name and limits are the same for each result]
    • 最终结果从死:PRR
  • Final results from wafer: WRR

未配置晶片设置的测试数据

For each part

  • Record for the part overall: PIR
  • 对于每个测试:
    • 参数测试结果:PTR [您的程序中每个数字限制测试]
    • Results for functional tests: FTR [One for each Pass/Fail test in your program]
    • Multi-Pin Parametric Test Result: MPR [contains an array of data where the test name and limits are the same for each result]
  • Final result from part: PRR

最终全球数据

  • Summary for each test in job plan: TSR
  • 每个HW箱中的部件数量:HBr
  • Count of parts placed in each SW bin: SBR
  • Part count totals: PCR
  • 总结总结:MRR

MPR extended capability

EuceShub扩展了MPR的能力。该测试记录类型用于在诸如连续性测试或输入泄漏的情况下与设备的引脚一起使用。但是,这一直延伸到用于任何重复测试,其中测试名称相同,限制是相同的。这是为了扩展PIN映射记录以覆盖每个阵列中所需的所有索引。例如,引脚数字1-99可用于频率扫描,其中引脚数对应于频率值。并且PIN数100至199可用于电压扫描。另外,这些引脚数可用于模具上的任何物理上重复的结构。在这种情况下,EightHUB为每个“引脚”输入XY位置的独特能力允许在晶片上和跨晶片穿过管料上映射的结果。



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